VLSI Test Principles and Architectures: Design for Testability

by Laung-Terng Wang, Xiaoqing Wen, Cheng-Wen Wu

Book Overview

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 1493300865
• ISBN13: 9781493300860
• Release Date: July 2006
• Publisher: Morgan Kaufmann Publishers
• Length: 808 Pages