VLSI Fault Modeling and Testing Techniques

by George W. Zobrist

VLSI systems are becoming very complex and difficult to test. Traditional stuck-at fault problems may be inadequate to model possible manufacturing defects in the integrated ciruit. Hierarchial models are needed that are easy to use at the transistor and functional levels. Stuck-open faults present severe testing problems in CMOS circuits, to overcome testing problems testable designs are utilized. Bridging faults are important due to the shrinking...

• Format: Hardcover
• Language: English
• ISBN: 0893917818
• ISBN13: 9780893917814
• Release Date: January 1993
• Publisher: Praeger
• Length: 208 Pages
• Weight: 0.91 lbs.
• Dimensions: 0.6" x 5.5" x 8.5"