Value Analysis Tear-Down: A New Process for Product Development and Innovation

by Yoshihiko Sat and J. Jerry Kaufman

This book presents, for the first time, a new technology for improving products and innovating new and better products, first developed in Japan by Yoshihiko Sato. Value analysis tear-down combines traditional tear-down with the technologies of value analysis and value engineering. Within a few years of its public announcement in Japan, value analysis tear-down was adopted by all eleven Japanese automobile manufacturers, and many of the Japanese consumer...

• Format: Hardcover
• Language: English
• ISBN: 0831132035
• ISBN13: 9780831132033
• Release Date: January 2004
• Publisher: Industrial Press
• Length: 176 Pages
• Weight: 1.05 lbs.
• Dimensions: 0.7" x 6.3" x 9.3"