Transport in Metal-Oxide-Semiconductor Structures: Mobile Ions Effects on the Oxide Properties

By Hamid Bentarzi

Book Overview

Introduction.- The MOS Structure.- The MOS Oxide and Its Defects.- Review of Transport Mechanism in Thin Oxides of MOS Devices.- Experimental Techniques.- Theoretical Approaches of Mobile Ions Density... This description may be from another edition of this product.

• Format: Hardcover
• Language: English
• ISBN: 3642163033
• ISBN13: 9783642163036
• Release Date: January 2011
• Publisher: Springer
• Length: 106 Pages
• Weight: 0.70 lbs.
• Dimensions: 0.5" x 6.1" x 9.2"