Trace-Based Post-Silicon Validation for VLSI Circuits

by Xiao Liu and Qiang Xu

Book Overview

This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits. The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective. A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal...

• Format: Paperback
• Language: English
• ISBN: 3319375946
• ISBN13: 9783319375946
• Release Date: August 2016
• Publisher: Springer
• Length: 108 Pages
• Weight: 0.41 lbs.
• Dimensions: 0.3" x 6.1" x 9.2"