Thin Film Materials: Stress, Defect Formation and Surface Evolution

by S. Suresh and L.B. Freund

Book Overview

Thin film mechanical behavior and stress presents a technological challenge for materials scientists, physicists and engineers. This book provides a comprehensive coverage of the major issues and... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 0521529778
• ISBN13: 9780521529778
• Release Date: January 2009
• Publisher: Cambridge University Press
• Length: 770 Pages
• Weight: 3.85 lbs.
• Dimensions: 1.7" x 6.7" x 9.6"