Thin Film Materials: Stress, Defect Formation and Surface Evolution

by S. Suresh and L.B. Freund

Book Overview

Thin film mechanical behavior and stress presents a technological challenge for materials scientists, physicists and engineers. This book provides a comprehensive coverage of the major issues and topics dealing with stress, defect formation, surface evolution and allied effects in thin film materials. Physical phenomena are examined from the continuum down to the sub-microscopic length scales, with the connections between the structure of the material...

• Format: Paperback
• Language: English
• ISBN: 0521529778
• ISBN13: 9780521529778
• Release Date: January 2009
• Publisher: Cambridge University Press
• Length: 770 Pages
• Weight: 3.85 lbs.
• Dimensions: 1.7" x 6.7" x 9.6"