Thermal and Power Management of Integrated Circuits

by Arman Vassighi and Manoj Sachdev

Book Overview

Power, Junction Temperature, and Reliability.- Burn-in as a Reliability Screening Test.- Thermal and Electrothermal Modeling.- Thermal Runaway and Thermal Management.- Low Temperature CMOS Operation.

• Format: Paperback
• Language: English
• ISBN: 144193832X
• ISBN13: 9781441938329
• Release Date: November 2010
• Publisher: Springer
• Length: 182 Pages
• Weight: 0.61 lbs.
• Dimensions: 0.4" x 6.1" x 9.2"