The Reliability and Validity of the School Success Profile

by Gary L. Bowen and John Morris Fenley

It is an honor to write the foreword for The Reliability and Validity of the School Success Profile (SSP). The SSP stands alone as one of the truly excellent, empirically validated, comprehensive, and... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 1413475434
• ISBN13: 9781413475432
• Release Date: July 2005
• Publisher: Xlibris Corporation
• Length: 188 Pages
• Weight: 0.54 lbs.
• Dimensions: 0.4" x 5.5" x 8.5"