Testing of Digital Systems

by Niraj K. Jha and Sandeep Gupta

Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of... This description may be from another edition of this product.

• Format: Hardcover
• Language: English
• ISBN: 0521773563
• ISBN13: 9780521773560
• Release Date: May 2003
• Publisher: Cambridge University Press
• Length: 1016 Pages
• Weight: 4.75 lbs.
• Dimensions: 1.9" x 7.2" x 10.0"