Testing Complex and Embedded Systems

by Kim H. Pries, Jon M. Quigley, Jon M Quigley

Many enterprises regard system-level testing as the final piece of the development effort, rather than as a tool that should be integrated throughout the development process. As a consequence, test teams often execute critical test plans just before product launch, resulting in much of the corrective work being performed in a rush and at the last minute.

Presenting combinatorial approaches for improving test coverage, Testing Complex...

• Format: Hardcover
• Language: English
• ISBN: 1439821402
• ISBN13: 9781439821404
• Release Date: January 2011
• Publisher: CRC Press
• Length: 320 Pages
• Weight: 1.30 lbs.
• Dimensions: 0.9" x 6.2" x 9.2"