Testing and Testable Design of High-Density Random-Access Memories

by Kanad Chakraborty and Pinaki Mazumder

This volume deals with the study of fault modelling, testing and testable design of semiconductor random-access memories. It is written primarily for the practising design engineer and the... This description may be from another edition of this product.

• Format: Hardcover
• Language: English
• ISBN: 0792397827
• ISBN13: 9780792397823
• Release Date: January 1996
• Publisher: Springer
• Length: 386 Pages
• Weight: 1.94 lbs.
• Dimensions: 1.1" x 6.4" x 9.5"