Testing and Reliable Design of CMOS Circuits

by Niraj K. Jha and Sandip Kundu

Book Overview

In the last few years CMOS technology has become increas- ingly dominant for realizing Very Large Scale Integrated (VLSI) circuits. The popularity of this technology is due to its high den- sity and... This description may be from another edition of this product.

• Format: Hardcover
• Language: English
• ISBN: 0792390563
• ISBN13: 9780792390565
• Release Date: December 1989
• Publisher: Springer
• Length: 232 Pages
• Weight: 1.19 lbs.
• Dimensions: 0.6" x 6.1" x 9.2"