Test and Diagnosis for Small-Delay Defects

by Mohammad Tehranipoor, Ke Peng, Krishnendu Chakrabarty

Book Overview

Introduction to VLSI Testing.- Delay Test and System-Delay Defects.- Long Path-Based Hybrid Method.- Process Variations- and Crosstalk-Aware Pattern Selection.- Power Supply Noise- and Crosstalk-Aware Hybrid Method.- SDD-Based Hybrid Method.- Maximizing Crosstalk Effect on Critical Paths.- Maximizing Power Supply Noise on Critical Paths.- Faster-than-at-speed Test.- Introduction to Diagnosis.- Diagnosing Noise-Induced SDDs by Using Dynamic SDF...

• Format: Paperback
• Language: English
• ISBN: 1489989528
• ISBN13: 9781489989529
• Release Date: November 2014
• Publisher: Springer
• Length: 212 Pages
• Weight: 0.73 lbs.
• Dimensions: 0.5" x 6.1" x 9.2"