System-On-Chip Test Architectures: Nanometer Design for Testability Volume .

by Nur A. Touba, Laung-Terng Wang, Charles E. Stroud, et al.

Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI...

• Format: Hardcover
• Language: English
• ISBN: 012373973X
• ISBN13: 9780123739735
• Release Date: December 2007
• Publisher: Morgan Kaufmann Publishers
• Length: 896 Pages
• Weight: 3.60 lbs.
• Dimensions: 1.6" x 7.7" x 9.3"