Skip to content
Scan a barcode
Scan
Paperback Surface Threshold Displacement Energy Measurement of Silicon Book

ISBN: 1288824335

ISBN13: 9781288824335

Surface Threshold Displacement Energy Measurement of Silicon


The Office of Scientific & Technical Information (OSTI), is a part of the U.S. Department of Energy (DOE) that houses research and development results from projects funded by the DOE. The information is generally an article, technical document, conference paper or dissertation. This is one of those publications.

Recommended

Format: Paperback

Condition: New

$54.91
Save $3.04!
List Price $57.95
50 Available
Ships within 2-3 days

Related Subjects

Education Education & Reference

Customer Reviews

0 rating
Copyright © 2024 Thriftbooks.com Terms of Use | Privacy Policy | Do Not Sell/Share My Personal Information | Cookie Policy | Cookie Preferences | Accessibility Statement
ThriftBooks® and the ThriftBooks® logo are registered trademarks of Thrift Books Global, LLC
GoDaddy Verified and Secured