Surface Infrared and Raman Spectroscopy: Methods and Applications

by W. Suetaka, John T. Yates, W. Suc+taka

are intended to fill the gap between a manufacturer's handbook, and review articles that highlight the latest scientific developments. A fourth volume will deal with techniques for specimen handling, beam artifacts, and depth profiling. It will provide a compilation of methods that have proven useful for specimen handling and treatment, and it will also address the common artifacts and problems associated with the bombardment of solid sur- faces by...

• Format: Hardcover
• Language: English
• ISBN: 0306449633
• ISBN13: 9780306449635
• Release Date: November 1995
• Publisher: Springer
• Length: 270 Pages
• Weight: 1.20 lbs.
• Dimensions: 0.8" x 6.6" x 9.7"