Surface Analysis of Polymers by XPS and Static Sims

by D. Briggs

Book Overview

This book provides an in-depth treatment of the instrumentation, physical bases and applications of X-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) with a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving. In this book, the techniques...

• Format: Paperback
• Language: English
• ISBN: 052101753X
• ISBN13: 9780521017534
• Release Date: December 2005
• Publisher: Cambridge University Press
• Length: 216 Pages
• Weight: 0.77 lbs.
• Dimensions: 0.5" x 6.7" x 9.6"