Surface Analysis of Polymers by XPS and Static Sims

by D. Briggs

Book Overview

This book provides an in-depth treatment of the instrumentation, physical bases and applications of X-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) with a... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 052101753X
• ISBN13: 9780521017534
• Release Date: December 2005
• Publisher: Cambridge University Press
• Length: 216 Pages
• Weight: 0.77 lbs.
• Dimensions: 0.5" x 6.7" x 9.6"