Stochastic Process Variation in Deep-Submicron CMOS: Circuits and Algorithms

by Amir Zjajo

Book Overview

One of the most notable features of nanometer scale CMOS technology is the increasing magnitude of variability of the key device parameters affecting performance of integrated circuits. The growth of variability can be attributed to multiple factors, including the difficulty of manufacturing control, the emergence of new systematic variation-generating mechanisms, and most importantly, the increase in atomic-scale randomness, where device operation...

• Format: Paperback
• Language: English
• ISBN: 9402402853
• ISBN13: 9789402402858
• Release Date: August 2016
• Publisher: Springer
• Length: 192 Pages
• Weight: 0.67 lbs.
• Dimensions: 0.5" x 6.1" x 9.2"