Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs

by Sheldon X Tan, Ruijing Shen, Hao Yu, et al.

Book Overview

Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have become imperative for the successful design of VLSI chips.

This book provides readers with tools for variation-aware design methodologies and computer-aided design (CAD) of VLSI systems, in...

• Format: Hardcover
• Language: English
• ISBN: 1461407877
• ISBN13: 9781461407874
• Release Date: March 2012
• Publisher: Springer
• Length: 306 Pages
• Weight: 1.42 lbs.
• Dimensions: 0.8" x 6.1" x 9.2"