Statistical Modeling for Computer-Aided Design of Mos VLSI Circuits

by Christopher Michael and Mohammed Ismail

Book Overview

As MOS devices are scaled to meet increasingly demanding circuit specifications, process variations have a greater effect on the reliability of circuit performance. For this reason, statistical techniques are required to design integrated circuits with maximum yield. Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits describes a statistical circuit simulation and optimization environment for VLSI circuit designers. The first step...

• Format: Hardcover
• Language: English
• ISBN: 079239299X
• ISBN13: 9780792392996
• Release Date: January 1993
• Publisher: Springer
• Length: 190 Pages
• Weight: 1.15 lbs.
• Dimensions: 0.5" x 6.1" x 9.2"