Statistical Modeling and Simulation for VLSI Circuits and Systems: Study on Uncertainty of Integrated Circuits

By Fang Gong

With the continuous technology advance, the feature size of nowadays integrated circuits (IC) has entered the nanometer era, which introduces many significant challenges for IC designs. This book... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 3639346297
• ISBN13: 9783639346299
• Release Date: April 2011
• Publisher: VDM Verlag
• Length: 64 Pages
• Weight: 0.23 lbs.
• Dimensions: 0.1" x 6.0" x 9.0"