Static Crosstalk-Noise Analysis: For Deep Sub-Micron Digital Designs

by Kurt Keutzer, Pinhong Chen, Desmond A Kirkpatrick, et al.

Book Overview

As the feature size decreases in deep sub-micron designs, coupling capacitance becomes the dominant factor in total capacitance. The resulting crosstalk noise may be responsible for signal integrity issues and significant timing variation. Traditionally, static timing analysis tools have ignored cross coupling effects between wires altogether. Newer tools simply approximate the coupling capacitance by a 2X Miller factor in order to compute the worst...

• Format: Paperback
• Language: English
• ISBN: 1475779496
• ISBN13: 9781475779493
• Release Date: May 2013
• Publisher: Springer
• Length: 113 Pages
• Weight: 0.43 lbs.
• Dimensions: 0.3" x 6.1" x 9.2"