Stability of IGZO-based Thin-Film Transistor

by John Wager and Ken Hoshino

Amorphous oxide semiconductors (AOSs) are of great current interest for thin-film transistor (TFT) channel layer applications. In particular, indium gallium zinc oxide (IGZO) is under intense... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 3838399633
• ISBN13: 9783838399638
• Release Date: September 2010
• Publisher: LAP Lambert Academic Publishing
• Length: 152 Pages
• Weight: 0.51 lbs.
• Dimensions: 0.3" x 6.0" x 9.0"