Semiconductor Process Reliability in Practice

by Zhenghao Gan, Waisum Wong, Juin J. Liou, et al.

Book Overview

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Proven processes for ensuring semiconductor device reliability

Co-written by experts in the field, Semiconductor Process Reliability in Practice contains detailed descriptions and analyses of reliability and qualification for semiconductor device...

• Format: Hardcover
• Language: English
• ISBN: 007175427X
• ISBN13: 9780071754279
• Release Date: October 2012
• Publisher: McGraw-Hill Companies
• Length: 624 Pages
• Weight: 2.19 lbs.
• Dimensions: 1.3" x 6.0" x 9.0"