Semiconductor Material and Device Characterization

by Dieter K. Schroder

Book Overview

This Third Edition updates a landmark text with the latest findings

The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations...

• Format: Hardcover
• Language: English
• ISBN: 0471739065
• ISBN13: 9780471739067
• Release Date: June 2015
• Publisher: Wiley-IEEE Press
• Length: 800 Pages
• Weight: 1.65 lbs.
• Dimensions: 1.6" x 5.7" x 8.8"

Customer Reviews

Essential text

This is an essential text for engineers, scientists, and graduate students working in the semiconductor field. It contains a thorough review of all major electrical, optical, and physical characterization methods that are commonly used. Descriptions of techniques are generally conceptually oriented, clearly stated, and do not rely excessively on equations. In addition, many useful figures are included to help explain concepts when introduced. Up to date references are included for essentially every technique mentioned.

Great reference

Schroder has compiled an extensive and very nearly complete guide to modern characterization techniques that apply mostly to semiconductors and solid state devices, but also to techniques used in general materials analysis. We used this text in a graduate level course in EE and found it easy to read through and concise for use as a quick reference. Well worth the money.

Semiconductor Material and Device Characterization

This book offers an outstanding review of various techniques of semiconductor device processing. It is the type of book that is an invaluable reference to the device engineer. It's breadth is outstanding.