Secondary Ion Mass Spectrometry Sims VIII

by K.T.F. Janssen and J. Tumpner

The proceedings of the Eighth International Conference on Secondary Ion Mass Spectrometry was held in Amsterdam, September 15-20, 1991. Contains over 200 contributions by international experts in their respective fields regarding the recent progress in analytical applications, instrument development and understanding the secondary ion formation and emission processes. Coverage includes techniques for extremely sensitive quantitative element analysis...

• Format: Hardcover
• Language: English
• ISBN: 0471930644
• ISBN13: 9780471930648
• Release Date: September 1992
• Publisher: Wiley
• Length: 944 Pages