Secondary Electron Energy Spectroscopy in the Scanning Electron Microscope

by Anjam Khursheed

This book deals with the subject of secondary energy spectroscopy in the scanning electron microscope (SEM). The SEM is a widely used research instrument for scientific and engineering research and its low energy scattered electrons, known as secondary electrons, are used mainly for the purpose of nanoscale topographic imaging. This book demonstrates the advantages of carrying out precision electron energy spectroscopy of its secondary electrons,...

• Format: Hardcover
• Language: English
• ISBN: 9811227020
• ISBN13: 9789811227028
• Release Date: November 2020
• Publisher: World Scientific Publishing Company
• Length: 344 Pages
• Weight: 1.38 lbs.
• Dimensions: 0.8" x 6.0" x 9.0"