Scanning Probe Microscopy (2 vol. set): Electrical and Electromechanical Phenomena at the Nanoscale

by Alexei Gruverman and Sergei V. Kalinin

Book Overview

Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents... This description may be from another edition of this product.

• Format: Hardcover
• Language: English
• ISBN: 0387286675
• Release Date: December 2006
• Publisher: Springer
• Length: 1018 Pages
• Weight: 1.95 lbs.
• Dimensions: 9.5" x 2.0" x 6.5"