Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy: A Laboratory Workbook

by Joseph I. Goldstein, Charles E. Lyman, Dale E. Newbury

During the last four decades remarkable developments have taken place in instrumentation and techniques for characterizing the microstructure and microcomposition of materials. Some of the most important of these instruments involve the use of electron beams because of the wealth of information that can be obtained from the interaction of electron beams with matter. The principal instruments include the scanning electron microscope, electron probe...

• Format: Hardcover
• Language: English
• ISBN: 0306435918
• ISBN13: 9780306435911
• Release Date: August 1990
• Publisher: Springer
• Length: 407 Pages
• Weight: 1.65 lbs.
• Dimensions: 0.8" x 7.1" x 9.8"