Scanning Electron Microscopy: Physics of Image Formation and Microanalysis

by Ludwig Reimer

Book Overview

Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.

• Format: Paperback
• Language: English
• ISBN: 3642083722
• ISBN13: 9783642083723
• Release Date: December 2010
• Publisher: Springer
• Length: 529 Pages
• Weight: 1.70 lbs.
• Dimensions: 1.1" x 6.1" x 9.0"