Skip to content
Scan a barcode
Scan
Hardcover RF and Time-Domain Techniques for Evaluating Novel Semiconductor Transistors Book

ISBN: 303077774X

ISBN13: 9783030777746

RF and Time-Domain Techniques for Evaluating Novel Semiconductor Transistors

This book presents a variety of techniques using high-frequency (RF) and time-domain measurements to understand the electrical performance of novel, modern transistors made of materials such as graphene, carbon nanotubes, and silicon-on-insulator, and using new transistor structures. The author explains how to use conventional RF and time- domain measurements to characterize the performance of the transistors. In addition, he explains how novel...

Recommended

Format: Hardcover

Condition: New

$99.99
50 Available
Ships within 2-3 days

Related Subjects

Engineering Technology

Customer Reviews

0 rating
Copyright © 2024 Thriftbooks.com Terms of Use | Privacy Policy | Do Not Sell/Share My Personal Information | Cookie Policy | Cookie Preferences | Accessibility Statement
ThriftBooks® and the ThriftBooks® logo are registered trademarks of Thrift Books Global, LLC
GoDaddy Verified and Secured