Reliability Physics and Engineering: Time-To-Failure Modeling

by J.W. McPherson and McPherson

Book Overview

1 Introduction 2 Materials and Device Degradation 2.1 Material/Device Parameter Degradation Modeling 2.1.1 Material/Device Parameter Decreases With Time 2.1.2 Material/Device Parameter Increases With Time 2.2 General Time-Dependent Degradation Models 2.3 Degradation Rate Modeling 2.4 Delays in the Start of Degradation 2.5 Competing Degradation Mechanisms 3 From Material/Device Degradation to Time-To-Failure 3.1 Time-To-Failure 3.2 Time-To-Failure...

• Format: Paperback
• Language: English
• ISBN: 3319033298
• ISBN13: 9783319033297
• Release Date: July 2015
• Publisher: Springer
• Length: 399 Pages
• Weight: 1.28 lbs.
• Dimensions: 0.8" x 6.1" x 9.2"