Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures

by Alexandre Schmid, Yusuf Leblebici, Milos Stanisavljevic

Book Overview

This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. Additionally, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components.

• Format: Hardcover
• Language: English
• ISBN: 1441962166
• ISBN13: 9781441962164
• Release Date: October 2010
• Publisher: Springer
• Length: 195 Pages
• Weight: 1.00 lbs.
• Dimensions: 0.7" x 6.2" x 9.2"