Reliability and Failure of Electronic Materials and Devices

by Milton Ohring

Book Overview

Suitable as a reference work for reliability professionals or as a text for advanced undergraduate or graduate students, this book introduces the reader to the widely dispersed reliability literature of microelectronic and electronic-optional devices. Reliability and Failure of Electronic Materials and Devices integrates a treatment of chip and packaging level failures within the context of the atomic mechanisms and models used to explain degradation,...

• Format: Hardcover
• Language: English
• ISBN: 0125249853
• ISBN13: 9780125249850
• Release Date: June 1998
• Publisher: Academic Press
• Length: 720 Pages
• Weight: 2.50 lbs.
• Dimensions: 1.4" x 6.2" x 9.2"