Reflection Electron Microscopy and Spectroscopy for Surface Analysis

by Zhong Lin Wang

Book Overview

In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics...

• Format: Paperback
• Language: English
• ISBN: 0521017955
• ISBN13: 9780521017954
• Release Date: August 2005
• Publisher: Cambridge University Press
• Length: 460 Pages
• Weight: 1.60 lbs.
• Dimensions: 0.9" x 6.7" x 9.6"