Quantum Metrology with Photoelectrons: Volume II: Applications and Advances

by Paul Hockett

Book Overview

Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and Advances discusses the fundamental concepts along with recent and emerging...

• Format: Hardcover
• Language: English
• ISBN: 1643270001
• ISBN13: 9781643270005
• Release Date: April 2018
• Publisher: Iop Concise Physics
• Length: 125 Pages
• Weight: 0.97 lbs.
• Dimensions: 0.4" x 7.0" x 10.0"