Practical Scanning Electron Microscopy: Electron and Ion Microprobe Analysis

by Joseph I. Goldstein and and Harvey Yakowitz (Editors) Goldstein, Joseph

Book Overview

In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States. They predicted that three to five might... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 1461344247
• ISBN13: 9781461344247
• Release Date: October 2011
• Publisher: Springer
• Length: 582 Pages
• Weight: 1.84 lbs.
• Dimensions: 1.2" x 6.1" x 9.2"