Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard

by Nicola Nicolici and Bashir M. Al-Hashimi

Book Overview

Minimization of power dissipation in very large scale integrated (VLSI) circuits is important to improve reliability and reduce packaging costs. While many techniques have investigated power minimization during the functional (normal) mode of operation, it is important to examine the power dissipation during the test circuit activity is substantially higher during test than during functional operation. For example, during the execution of built-in...

• Format: Paperback
• Language: English
• ISBN: 1441953159
• ISBN13: 9781441953155
• Release Date: December 2010
• Publisher: Springer
• Length: 178 Pages
• Weight: 0.61 lbs.
• Dimensions: 0.4" x 6.1" x 9.2"