Photo-Excited Charge Collection Spectroscopy: Probing the Traps in Field-Effect Transistors

by Seongil Im

Chapter 1. Device Stability and Photo-Excited Charge-Collection Spectroscopy.
1.1. Thin-film transistor architectures for photon probe measurements.
1.2. Device physics and equations for thin-film transistors.
1.3. Stability issues: Hysteresis by Gate Voltage Sweep.
1.4. Stability issues: Bias-Temperature-Stress.
1.5. Stability issues: Photostability.
1.6. Stability issues: Back Channel Current.
1.7. Importance of dielectric/channel...

• Format: Paperback
• Language: English
• ISBN: 9400763913
• ISBN13: 9789400763913
• Release Date: May 2013
• Publisher: Springer
• Length: 101 Pages
• Weight: 0.38 lbs.
• Dimensions: 0.2" x 6.1" x 9.2"