Noise in Bipolar Junction Transistors at Cryogenic Temperatures.

by Thomas Wade

Book Overview

Abstract:

Fluctuation phenomenon (both thermal and shot noise) were measured in the junctions of bipolar junction transistors (BJT's) at liquid nitrogen temperatures and beyond.

Dissertation Discovery Company and the University of Florida are dedicated to making scholarly works more discoverable and accessible throughout the world. This dissertation, "Noise in Bipolar Junction Transistors at Cryogenic Temperatures." by Thomas Edward...

• Format: Paperback
• Language: English
• ISBN: 0530019485
• ISBN13: 9780530019482
• Release Date: December 2019
• Publisher: Dissertation Discovery Company
• Length: 258 Pages
• Weight: 1.33 lbs.
• Dimensions: 0.5" x 8.5" x 11.0"