New Horizons of Applied Scanning Electron Microscopy

by Tomoaki Mitani, Kenichi Shimizu, Tomoaki Mitani Kenichi Shimizu

Book Overview

Application Example 1: Lateral Resolution of in-Lens SE and High-Angle BSE Imaging at Low Accelerating Voltages, Below 2.0 kV.- Application Example 2: Z-Contrast Sensitivity in Low-Voltage, High-Angle BSE Imaging.- Application Example 3: Information Depth in Low-Voltage, High-Angle BSE Imaging.- Application Example 4: Nano Inclusions in Co-Hardened Gold Plating for Electronic Applications #x2013; Further Evidence for High Lateral Resolution in Low-Voltage,...

• Format: Paperback
• Language: English
• ISBN: 364226168X
• ISBN13: 9783642261688
• Release Date: May 2012
• Publisher: Springer
• Length: 182 Pages
• Weight: 0.65 lbs.
• Dimensions: 0.5" x 6.1" x 9.0"