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Hardcover Nanometer Variation-Tolerant Sram: Circuits and Statistical Design for Yield Book

ISBN: 1461417481

ISBN13: 9781461417484

Nanometer Variation-Tolerant Sram: Circuits and Statistical Design for Yield

Introduction.- Variability in Nanometer Technologies and Impact on SRAM.- Variarion-Tolerant SRAM Write and Read Assist Techniques.- Reducing SRAM Power using Fine-Grained Wordline Pulse Width Control.- A Methodology for Statistical Estimation of Read Access Yield in SRAMs.- Characterization of SRAM Sense Amplifier Input Offset for Yield Prediction.

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Format: Hardcover

Condition: New

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