Nanometer Variation-Tolerant Sram: Circuits and Statistical Design for Yield

by Mohamed Abu-Rahma and Mohab Anis

Introduction.- Variability in Nanometer Technologies and Impact on SRAM.- Variarion-Tolerant SRAM Write and Read Assist Techniques.- Reducing SRAM Power using Fine-Grained Wordline Pulse Width Control.- A Methodology for Statistical Estimation of Read Access Yield in SRAMs.- Characterization of SRAM Sense Amplifier Input Offset for Yield Prediction.

• Format: Hardcover
• Language: English
• ISBN: 1461417481
• ISBN13: 9781461417484
• Release Date: September 2012
• Publisher: Springer
• Length: 172 Pages
• Weight: 0.85 lbs.
• Dimensions: 0.6" x 6.2" x 9.2"