Nanometer-Scale Defect Detection Using Polarized Light

by Philippe Pougnet, Pierre-Richard Dahoo, Abdelkhalak El Hami

This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular... This description may be from another edition of this product.

• Format: Hardcover
• Language: English
• ISBN: 1848219369
• ISBN13: 9781848219366
• Release Date: August 2016
• Publisher: Wiley-Iste
• Length: 316 Pages
• Weight: 1.36 lbs.
• Dimensions: 0.8" x 6.1" x 9.2"