MOS Interface Physics, Process and Characterization

by Shengkai Wang and Xiaolei Wang

Book Overview

The electronic device based on Metal Oxide Semiconductor (MOS) structure is the most important component of a large-scale integrated circuit and the key to achieving high performance devices. This book contains experimental examples focusing on MOS and will be a reference for academics and postgraduates in the field of microelectronics.

• Format: Paperback
• Language: English
• ISBN: 103210628X
• ISBN13: 9781032106281
• Release Date: October 2021
• Publisher: CRC Press
• Length: 162 Pages
• Weight: 0.53 lbs.
• Dimensions: 0.4" x 6.0" x 9.0"