Modeling of Electrical Overstress in Integrated Circuits

by Sung-Mo Kang, Carlos H. Diaz, Charvaka Duvvury

Book Overview

Electrical overstress (EOS) and Electrostatic discharge (ESD) pose one of the most dominant threats to integrated circuits (ICs). These reliability concerns are becoming more serious with the downward scaling of device feature sizes. Modeling of Electrical Overstress in Integrated Circuits presents a comprehensive analysis of EOS/ESD-related failures in I/O protection devices in integrated circuits. The design of I/O protection circuits has been done...

• Format: Paperback
• Language: English
• ISBN: 1461362059
• ISBN13: 9781461362050
• Release Date: September 2012
• Publisher: Springer
• Length: 148 Pages
• Weight: 0.57 lbs.
• Dimensions: 0.4" x 6.1" x 9.2"