Modeling Nanoscale Imaging in Electron Microscopy

by Wolfgang Dahmen, Peter Binev, Thomas Vogt

Book Overview

Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs...

• Format: Hardcover
• Language: English
• ISBN: 146142190X
• ISBN13: 9781461421900
• Release Date: March 2012
• Publisher: Springer
• Length: 182 Pages
• Weight: 0.90 lbs.
• Dimensions: 0.8" x 6.2" x 9.2"