Mitigating Process Variability and Soft Errors at Circuit-Level for Finfets

by Alexandra Zimpeck

Book Overview

This book evaluates the influence of process variations (e.g. work-function fluctuations) and radiation-induced soft errors in a set of logic cells using FinFET technology, considering the 7nm technological node as a case study. Moreover, for accurate soft error estimation, the authors adopt a radiation event generator tool (MUSCA SEP3), which deals both with layout features and electrical properties of devices. The authors also explore four circuit-level...

• Format: Paperback
• Language: English
• ISBN: 3030683702
• ISBN13: 9783030683702
• Release Date: March 2022
• Publisher: Springer
• Length: 131 Pages
• Weight: 0.48 lbs.
• Dimensions: 0.3" x 6.1" x 9.2"